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Project Information
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Note: Original team as dissolved as of Summer 2008. If you have any questions please contact Greg Bray or the faculty advisor Ken Stevens kstevens(a)ece.utah.edu Project OverviewTo build a low cost and simple platform capable of testing NAND flash memory and measuring the failure behavior under different usage patterns. Project ObjectivesBuild a simple, flexible, bench top platform for SLC NAND endurance cycle-life testing Create separate modular functions that can:
The user should be able to input (via script, GUI, etc) the set of commands necessary to configure the test environment to perform any sequence of the above functions User to specify the range of blocks of the device which are to be tested User to specify the number of cycles that each function is to be repeated User to select auto-generated random seed data, or be allowed to input a single pattern for device testing Collect stats on failures and cycle counts Project Links |